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Our goal is to understand the reliability physics of novel electronic device technologies using a unique interdisciplinary approach.

Device technologies we currently study include:

  • Ultra-wide bandgap power electronics (Ga2O3, AlGaN, and diamond based systems)
  • Wide bandgap semiconductor devices (lateral GaN HEMTs, vertical GaN diodes/transistors, InGaN LEDs, SiC devices)
  • ScAlN and PZT thin film piezoelectric MEMS
  • 2-D layered materials and devices (transition metal dichalcogenides including MoS2)

We specialize in:

  • Micro/nanoscale optical thermography
  • Multiphysics simulation
  • Electrical stress tests
  • Thermo-physical property measurement
  • Device-level thermal management

We are grateful for generous support by:

  • Air Force Office of Scientific Research
  • Center for Dielectrics and Piezoelectrics

            

Updated 11/1/2018