Alem Research Group
With the utilization of advanced electron microscopy imaging and spectroscopy techniques, our research is focused to understand and address the existing challenges in novel nanostructures and devices. We utilize Scanning/Transmission Electron Microscopy (S/TEM) imaging and spectroscopy and develop advanced data analysis and machine learning algorithms to further uncover a variety of phenomena in materials including low dose imaging of beam sensitive materials, atomic scale metrology of defects and quantification of sub-Angstrom relaxation effects in nanostructures as well as their nanoscale plasmonic and electronic properties.
Group News
March 2023
- We would like to welcome our new Assistant Research Professor, Dr. Anuj Bisht. Welcome to Alem group Dr. Bisht!
February 2023
- Our grad student, Saiphaneendra Bachu has accepted a TEM Analysis Engineer role at Samsung. Congratulations on a successful thesis defense! We wish Dr. Bachu luck in his new endeavor!
October 2022
- Our grad student, Leixin Miao has accepted a TD Module & Integration Yield Engineer position at Intel. Congratulations on a successful thesis defense! We wish Dr. Miao luck in his new endeavor!