The Zygo Corporation ZeGage optical profilometer is available at Behrend for optical, non-contact measurements of a sample’s surface. SKF has generously allowed the optical profilometer to reside at Behrend in the AMIC building.
Sample Specifications
Samples must fit within the working area of the optical profilometer. The maximum z-height is 100 mm, thus samples must have a height less than this. The x/y stage can move a maximum 100 mm by 100 mm, thus the area of analysis must be less than this.
The maximum vertical scan range is 20 mm. Features of interest on a sample surface should be less than 20 mm in height variability in order for the optical profilometer to be able to capture the profile in a single scan.
Advancing Research
Using this instrument, researchers at Behrend have been able to generate 2D and 3D representations of a sample surface, as well as make fine measurements of features on a sample surface. Some examples of researchers at Behrend making use of the optical profilometer include:
- Dr. Paul Lynch and Benjamin Fahrney were trying to measure surface finish of additively manufactured parts to find if there was a significant difference in the quality of parts that were printed on a desk, on the carpet, and on dampening pads.
- Dr. Beth Last analyzed the surface of a fish scale using the optical profilometer. The hope was that observed rings and ridges would provide insight into the age of the fish. The scale is taken from a fish captured by Dr. Lynne Beaty.
Interested in using the optical profilometer or having Behrend staff run samples on the profilometer for you? Please complete our contact page.