scanning probe microscopy
For topographic measurements and local property measurements (piezoresponse, modulus, conductivity, etc…) we use an Oxford Asylum MFP-3D scanning probe microscope. The instrument is configured for atomic force, piezo-force, conductivity, magnetic force, and later force modes. This is a work horse instrument for understanding surface microstructure – process – property relationships for numerous research programs.
Many group members use the AFM, but Kevin Ferri is the principal user.