ellipsometry – visible

We manage a Film Sense FS-1EX multi-wavelength ellipsometer system with a 6-LED spectral range spanning 405-950 nm. As shown below, the instrument can be used in stand-alone condition for ex situ measurements of transparent and semi-metallic materials, or it can be mounted onto one of several sputter tools for in situ measurement of thickness, roughness, or optical constants.

Many group members use the visible ellipsometer, but Jack Hayden is the principal user.