x-ray fluorescence

For composition analysis, our group uses a Malvern-Panalytical Epsilon-1 x-ray fluorescence spectrometer. The compact benchtop unit offers ppm detection limits for elements heavier than nitrogen and can measure bulk samples, liquids, and thin films. The instrument features the Stratos software package that can be used to model thin film|substrate and multilayer film stacks so that composition profiles of sophisticated stacks can be modeled.