| Subangstrom edge relaxations probed by electron microscopy in hexagonal boron nitride
N Alem, QM Ramasse, CR Seabourne, OV Yazyev, K Erickson, …
Physical review letters 109 (20), 205502
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58 | 2012 |
| Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS
Q Ramasse, N Alem, A Zettl, O Yazyev, C Pan, R Nair, R Jalil, R Zan, …
Microscopy and Microanalysis 18 (S2), 1526-1527
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2012 | |
| Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study
N Alem, S Louie, A Zettl, Q Ramasse, O Yazyev, C Seabourne, A Scott, …
Microscopy and Microanalysis 18 (S2), 1516-1517
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2012 | |
| High resolution transmission electron microscopy of lattice dynamics of graphene
JH Chen, N Alem, A Gautam, M Linck, C Kisielowski, A Zettl
APS March Meeting Abstracts 2012, W11. 013
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2012 | |
| Boron Nitride Nanoribbons: Synthesis and Future Directions
A Gibb, K Erikson, A Sinitskii, M Rousseas, N Alem, J Tour, A Zettl
APS March Meeting Abstracts 2012, Z11. 014
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2012 |
